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Wafer Electrical Test Data and SPICE Model Parameters
MOSIS provides electrical test data and SPICE parameters for most wafer lots.
Lot-specific parametric results and SPICE device model parameters are extracted from measurements on wafers probed at MOSIS.
SPICE level 3 model parameters for classroom instructional purposes, not for actual IC design work are also available.
ON Semiconductor
ON Semi 0.50 micron (C5)
ON Semi 1.50 micron (ABN) [inactive]
IBM
IBM 0.50 micron (5HP, 5AM, 5DM, 5PA)
IBM 0.35 micron (5HPE, 5PAe)
IBM 0.25 micron (6HP, 6DM, 6RF)
IBM 0.18 micron (7RF, 7RFSOI, 7WL, 7SF, 7HP)
IBM 0.13 micron (8RF-LM, 8RF-DM, 8HP, 8WL)
IBM 90 nanometer (9SF, 9LP, 9RF)
IBM 65 nanometer (10SF, 10LPe/10RFe)
IBM 45 nanometer (12SOI)
IBM 32 nanometer (32SOI)